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1

Performance Check of a Wavelength Dispersive X-Ray Spectrometer (WDS) attached to the SEM

Hodoroaba, V-D, Procop, M

Journal:

Microscopy and Microanalysis

Year:

2009

Language:

english

File:

PDF, 409 KB

english, 2009

2

X-Ray Scattering and its Benefits for X-Ray Spectrometry at the SEM

Hodoroaba, V-D, Rackwitz, V, Reuter, D

Journal:

Microscopy and Microanalysis

Year:

2009

Language:

english

File:

PDF, 251 KB

english, 2009

3

A New Material for the Performance Check of X-ray Spectrometers Attached to a SEM

Procop, M, Hodoroaba, V-D, Griepentrog, M

Journal:

Microscopy and Microanalysis

Year:

2006

Language:

english

File:

PDF, 171 KB

english, 2006

4

Calculation of X-ray spectra for a Side Window Tube

Procop, M, Hodoroaba, V-D, Bjeoumikhov, A

Journal:

Microscopy and Microanalysis

Year:

2006

Language:

english

File:

PDF, 148 KB

english, 2006

5

Combination of Energy Dispersive Electron Probe Microanalysis with X-ray Fluorescence Analysis in a SEM

Procop, M, Hodoroaba, V-D

Journal:

Microscopy and Microanalysis

Year:

2007

Language:

english

File:

PDF, 563 KB

english, 2007

6

A Test Material and a quick Procedure for the Performance Check of X-Ray Spectrometers attached to the SEM

Procop, M, Hodoroaba, V-D

Journal:

Microscopy and Microanalysis

Year:

2009

Language:

english

File:

PDF, 614 KB

english, 2009

7

Micro-Focus X-Ray Fluorescence (µ-XRF) as an Extension of the Analytical SEM

Hodoroaba, V-D, Rackwitz, V, Reuter, D

Journal:

Microscopy and Microanalysis

Year:

2010

Language:

english

File:

PDF, 843 KB

english, 2010

8

Characterization of Polycapillary X-Ray Semilenses with SEM/EDX

Rackwitz, V, Procop, M, Hodoroaba, V-D

Journal:

Microscopy and Microanalysis

Year:

2010

Language:

english

File:

PDF, 1.00 MB

english, 2010

9

Physical Modeling of the Background of XRF Spectra

Reuter, D, Hodoroaba, V-D

Journal:

Microscopy and Microanalysis

Year:

2010

Language:

english

File:

PDF, 407 KB

english, 2010

10

Determination of Emitted X-Ray Tube Spectra by Means of a Calibrated Instrumental Setup

Rackwitz, V, Warrikhoff, A, Panne, U, Hodoroaba, V-D

Journal:

Microscopy and Microanalysis

Year:

2010

Language:

english

File:

PDF, 1.05 MB

english, 2010

11

Instrumental Performance Parameters for Specification and Check of Energy Dispersive X-Ray Spectrometers as in the International Standard ISO 15632

Journal:

Microscopy and Microanalysis

Year:

2011

Language:

english

File:

PDF, 923 KB

english, 2011

12

EPMA on Copper-Gold Alloys - A CCQM/SAWG Pilot Study

Hodoroaba, V-D, Marinenko, R, Small, J, Unger, W

Journal:

Microscopy and Microanalysis

Year:

2011

Language:

english

File:

PDF, 5.40 MB

english, 2011

13

Advanced Elemental Analysis with ED-EPMA, WD-EPMA and µ-XRF at a SEM

Hodoroaba, V-D, Salge, T, Terborg, R, Rackwitz, V

Journal:

Microscopy and Microanalysis

Year:

2011

Language:

english

File:

PDF, 1.11 MB

english, 2011

14

Characterisation of nanoparticles by means of high-resolution SEM/EDS in transmission mode

Hodoroaba, V-D, Rades, S, Salge, T, Mielke, J, Ortel, E, Schmidt, R

Journal:

IOP Conference Series Materials Science and Engineering

Year:

2016

Language:

english

File:

PDF, 6.69 MB

english, 2016